2025 Volume 15 Issue 6
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Ronghua Wang, Beiqing Gu, Xiaoling Xu. RELIABILITY ANALYSIS OF MASKED DATA FOR EXPONENTIALLY DISTRIBUTED COMPONENTS UNDER MULTIPLE TYPE-Ⅱ CENSORING[J]. Journal of Applied Analysis & Computation, 2025, 15(6): 3826-3849. doi: 10.11948/20250074
Citation: Ronghua Wang, Beiqing Gu, Xiaoling Xu. RELIABILITY ANALYSIS OF MASKED DATA FOR EXPONENTIALLY DISTRIBUTED COMPONENTS UNDER MULTIPLE TYPE-Ⅱ CENSORING[J]. Journal of Applied Analysis & Computation, 2025, 15(6): 3826-3849. doi: 10.11948/20250074

RELIABILITY ANALYSIS OF MASKED DATA FOR EXPONENTIALLY DISTRIBUTED COMPONENTS UNDER MULTIPLE TYPE-Ⅱ CENSORING

  • In the case of multiple type-Ⅱ censoring, the maximum likelihood estimations of the parameters are proposed for the masked data of the series system of two components with exponential life distribution (same and different parameters), and the uniqueness of the likelihood equation root is proved. The Bayes point estimations and interval estimations of the parameters are also given under the assumption that the prior distribution is Gamma distribution. Besides, the likelihood function is deduced theoretically for the masked data of the parallel system with two components with exponential life distribution (same parameters), and the uniqueness of maximum likelihood estimation is proved. The Bayes point estimation and interval estimation of the parameter is proposed under the assumption of Gamma distribution. The application of the method is illustrated through simulation data in various situations.

    MSC: 62N05
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  • [1] F. Azizi, F. Haghighi, E. Ghadiri and L. Torabi, Statistical inference for masked interval data with Weibull distribution under simple step-stress test and tampered failure rate model, Journal of Risk and Reliability, 2017, 23(6), 654-665.

    Google Scholar

    [2] J. Cai, Y. Shi and B. Liu, Inference for a series system with dependent masked data under progressive interval censoring, Journal of Applied Statistics, 2017, 44(1), 3-15.

    Google Scholar

    [3] J. Cai, Y. Shi and Y. Zhang, Robust Bayesian analysis for parallel system with masked data under inverse Weibull lifetime distribution, Communications in Statistics-Theory and Methods, 2020, 49(6), 1422-1434.

    Google Scholar

    [4] N. Doganaksoy, Interval estimation from censored $ & $ masked system-failure data, IEEE Transactions on Reliability, 1991, 40(3), 280-286.

    Google Scholar

    [5] T. H. Fan and W. L. Wang, Accelerated life tests for Weibull series systems with masked data, IEEE Transactions on Reliability, 2011, 60(3), 557-569.

    Google Scholar

    [6] X. Gu and Y. Shi, Estimation of generalized Rayleigh components reliability in a parallel system using dependent masked data, Journal of Physical Science, 2011, 15, 33-42.

    Google Scholar

    [7] H. Hou, Y. Jiang and Y. Shi, Parameter estimations in Burr XII model using masked data, Chinese Quarterly Journal of Mathematics, 2011, 26(2), 251-255.

    Google Scholar

    [8] D. E. Hutto, T. Mazzuchi and S. Sarkani, Analysis of reliability using masked system life data, International Journal of Quality & Reliability Management, 2009, 26(7), 723-739.

    Google Scholar

    [9] D. K. J. Lin, J. S. Usher and F. M. Guess, Bayes estimation of component reliability from masked system-life data, IEEE Transactions on Reliability, 1996, 45(2), 233-237.

    Google Scholar

    [10] D. K. J. Lin, J. S. Usher and F. M. Guess, Exact maximum likelihood estimation using masked system data, IEEE Transactions on Reliability, 1993, 42(4), 631-635.

    Google Scholar

    [11] B. Liu, Y. Shi, J. Cai, X. Bai and C. Zhang, Nonparametric Bayesian analysis of masked data from hybrid systems in accelerated lifetime tests, IEEE Transactions on Reliability, 2017, 66(3), 662-676.

    Google Scholar

    [12] B. Liu, Y. Shi, H. K. T. Ng and X. Shang, Nonparametric Bayesian reliability analysis of masked data with dependent competing risks, Reliability Engineering & System Safety, 2021, 210, 1-11.

    Google Scholar

    [13] B. Liu, Y. Shi, F. Zhang and X. Bai, Reliability nonparametric Bayesian estimation for masked data of parallel systems in step-stress accelerated life tests, Journal of Computationa and Applied Mathematics, 2017, 311, 375-386.

    Google Scholar

    [14] H. Misaii, F. Haghighi and M. Fouladirad, Opportunistic perfect preventive maintenance policy in presence of masked data, Journal of Risk and Reliability, 2022, 236(6), 1024-1036.

    Google Scholar

    [15] A. S. Podrigues, C. A. B. Pereira and A. Polpo, Estimation of component reliability in coherent systems with masked data, IEEE Access, 2019, 7, 57476-57487.

    Google Scholar

    [16] H. Rai, M. S. Panwar and S. K. Tomer, Analysis of masked data with Lindley failure model, Communications in Statistics-Simulation and Computation, 2023, 52(4), 1192-1211.

    Google Scholar

    [17] B. Reiser, I. Gutman, D. K. J. Lin, F. M. Guess and J. S. Usher, Bayesian inference for masked system lifetime data, Applied Statistics, 1995, 44(1), 79-90.

    Google Scholar

    [18] A. M. Sarhan, Estimation of system components reliabilities using masked data, Applied Mathematics and Computation, 2003, 136, 79-92.

    Google Scholar

    [19] A. M. Sarhan, Parameter estimations in a general hazard rate model using masked data, Applied Mathematics and Computation, 2004, 153, 513-536.

    Google Scholar

    [20] A. M. Sarhan, Parameter estimations in a linear failure rate model using masked data, Applied Mathematics and Computation, 2004, 151, 233-249.

    Google Scholar

    [21] A. M. Sarhan, Reliability estimations of components from masked system life data, Reliability Engineering & System Safety, 2001, 74, 107-113.

    Google Scholar

    [22] A. M. Sarhan, The Bayes procedure in exponential reliability family models using conjugate convex tent prior family, Reliability Engineering & System Safety, 2001, 71, 97-102.

    Google Scholar

    [23] A. M. Sarhan and A. H. El-Bassiouny, Estimation of components reliability in a parallel system using masked system life data, Applied Mathematics and Computation, 2003, 138, 61-75.

    Google Scholar

    [24] A. Sen, M. Banerjee, Y. Li and A. M. Noone, A Bayesian approach to competing risks analysis with masked cause of death, Statistics in Medicine, 2010, 29(16), 1681-1695.

    Google Scholar

    [25] S. F. Shah, S. A. Cheema, Z. Hussain and E. A. Shah, Masking data: A solution to social desirability bias in paired comparison experiments, Communications in Statistics-Simulation and Computation, 2022, 51(6), 3149-3167.

    Google Scholar

    [26] P. W. Srivastava and Savita, An accelerated life test plan for a two-component parallel system under ramp-stress loading using masked data, International Journal of Quality & Reliability Management, 2018, 36(3), 811-820.

    Google Scholar

    [27] S. K. Tomer, A. K. Singh and M. S. Panwar, Bayesian analysis of masked series system lifetime data from a family of lifetime distributions, International Journal of System Assurance, Engineering and Management, 2014, 5(4), 496-502.

    Google Scholar

    [28] J. S. Usher, Weibull component reliability-prediction in the presence of masked data, IEEE Transactions on Reliability, 1996, 45(2), 229-232.

    Google Scholar

    [29] J. S. Usher and T. J. Hodgson, Maximum likelihood analysis of component reliability using masked system life-test data, IEEE Transactions on Reliability, 1988, 37(5), 550-555.

    Google Scholar

    [30] M. Wakaiki, K. Suto and I. Masubuchi, Cell zooming with masked data for off-grid small cell networks: Distributed optimization approach, IEEE Transactions on Control Systems Technology, 2022, 30(4), 1696-1710.

    Google Scholar

    [31] A. Xu, S. Basu and Y. Tang, A full Bayesian approach for masked data in step-stress accelerated life testing, IEEE Transactions on Reliability, 2014, 63(3), 798-806.

    Google Scholar

    [32] A. Xu and Y. Tang, An overview on statistical analysis for masked system lifetime data, Chinese Journal of Applied Probability and Statistics, 2012, 28(4), 380-388.

    Google Scholar

    [33] A. Xu and Y. Tang, Bayesian analysis of Pareto reliability with dependent masked data, IEEE Transactions on Reliability, 2009, 58(4), 583-588.

    Google Scholar

    [34] J. Yang, J. Chen and X. Wang, EM algorithm for estimating reliability of multi-release open-source software based on general masked data, IEEE Access, 2021, 9, 18890-18903.

    Google Scholar

    [35] J. Yang, M. Zhao and J. Chen, ELS algorithm for estimating open-source software reliability with masked data considering both fault detection and correction processes, Communications in Statistics-Theory and Methods, 2022, 51(19), 6792-6817.

    Google Scholar

    [36] M. Zhang, S. Lu and Y. Yang, Reliability estimation of system components under masked data with multiple type-Ⅱ censoring, Systems Engineering and Electronics, 2013, 35(5), 1122-1127.

    Google Scholar

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